Hysitron PI 85L SEM PicoIndenter

The PI 85L is suitable for a variety of applications

Multiphase Materials
 

SEM imaging enables highly-accurate probe placement for nanoindentation testing of single phases or regions of a sample.

Structures
 

Pillars, particles, and novel structures can be deflected or compressed in-situ to quantify deformation and fracture.

1D and 2D Materials
 

Perform tensile loading of thin films, graphene, and nanowires and obtain stress-strain behavior of hard to test samples.

Interfaces and Coatings
 

Identify and test across boundaries or gradients. Observe failures and identify their path across a coating/substrate interface.

상호 : 나노비즈 코리아  사업자등록번호: 520-65-00158

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