Hysitron PI 85L SEM PicoIndenter

The PI 85L is suitable for a variety of applications

Multiphase Materials

SEM imaging enables highly-accurate probe placement for nanoindentation testing of single phases or regions of a sample.


Pillars, particles, and novel structures can be deflected or compressed in-situ to quantify deformation and fracture.

1D and 2D Materials

Perform tensile loading of thin films, graphene, and nanowires and obtain stress-strain behavior of hard to test samples.

Interfaces and Coatings

Identify and test across boundaries or gradients. Observe failures and identify their path across a coating/substrate interface.

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