Hysitron PI 85L SEM PicoIndenter
The PI 85L is suitable for a variety of applications
SEM imaging enables highly-accurate probe placement for nanoindentation testing of single phases or regions of a sample.
Pillars, particles, and novel structures can be deflected or compressed in-situ to quantify deformation and fracture.
1D and 2D Materials
Perform tensile loading of thin films, graphene, and nanowires and obtain stress-strain behavior of hard to test samples.
Interfaces and Coatings
Identify and test across boundaries or gradients. Observe failures and identify their path across a coating/substrate interface.